The relationship between hydrogen and paramagnetic defects in thin film silicon irradiated with 2 MeV electrons
Astakhov, O, Carius, R, Petrusenko, Yu, Borysenko, V, Barankov, D, Finger, FVolume:
24
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/24/30/305801
Date:
August, 2012
File:
PDF, 594 KB
english, 2012