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Electronic structure of amorphous Si measured by (e,2e) spectroscopy
Vos, M, Storer, P, Cai, Y Q, Kheifets, A S, McCarthy, I E, Weigold, EVolume:
7
Language:
english
Journal:
Journal of Physics: Condensed Matter
DOI:
10.1088/0953-8984/7/2/006
Date:
January, 1995
File:
PDF, 183 KB
english, 1995