A precision length measuring system for a variety of linear...

Measurement Science and Technology 2001 / 06 Vol. 12; Iss. 6

A precision length measuring system for a variety of linear artefacts

Eom, TaeBong, Han, JinWan
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Volume:
12
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/12/6/307
Date:
June, 2001
File:
PDF, 154 KB
english, 2001
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