High resolution electron imaging system for sub-micron...

Measurement Science and Technology 2005 / 10 Vol. 16; Iss. 10

High resolution electron imaging system for sub-micron sized metastable atom beams produced by Stern–Gerlach interferometry

Milosavljević, A R, Bočvarski, V, Jureta, J, Marinković, B P, Karam, J-C, Grucker, J, Perales, F, Vassilev, G, Reinhardt, J, Robert, J, Baudon, J
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Volume:
16
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/16/10/015
Date:
October, 2005
File:
PDF, 607 KB
english, 2005
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