![](/img/cover-not-exists.png)
A simple interferometric method for determining the flatness of large optical flats with 1 nm repeatability
Křen, PetrVolume:
19
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/19/10/107001
Date:
October, 2008
File:
PDF, 108 KB
english, 2008