A simple procedure based on the PCD method for...

Measurement Science and Technology 1994 / 01 Vol. 5; Iss. 1

A simple procedure based on the PCD method for determination of recombination lifetime and surface recombination velocity in silicon

Fontaine, J C, Barthe, S, Ponpon, J P, Schunck, J P, Siffert, P
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Volume:
5
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/5/1/008
Date:
January, 1994
File:
PDF, 344 KB
english, 1994
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