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The method of dynamic separation and its application to quantitative thermal analysis of microelectronic devices by laser interferometry and reflectometry
Phan, T, Dilhaire, S, Quintard, V, Lewis, D, Claeys, WVolume:
8
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/8/3/013
Date:
March, 1997
File:
PDF, 362 KB
english, 1997