Testing high-resolution digitizers using conventional...

Testing high-resolution digitizers using conventional signal sources

Simões, J Basílio, Loureiro, Custódio F M, Landeck, Jorge, Correia, Carlos M B A
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Volume:
9
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/9/1/002
Date:
January, 1998
File:
PDF, 126 KB
english, 1998
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