Testing high-resolution digitizers using conventional signal sources
Simões, J Basílio, Loureiro, Custódio F M, Landeck, Jorge, Correia, Carlos M B AVolume:
9
Language:
english
Journal:
Measurement Science and Technology
DOI:
10.1088/0957-0233/9/1/002
Date:
January, 1998
File:
PDF, 126 KB
english, 1998