Quick atomic-scale structure imaging by synchrotron x-rays: a new tool for probing realistic inhomogeneous systems
Sakurai, Kenji, Mizusawa, MariVolume:
15
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/15/6/021
Date:
June, 2004
File:
PDF, 323 KB
english, 2004