Quick atomic-scale structure imaging by synchrotron x-rays:...

Quick atomic-scale structure imaging by synchrotron x-rays: a new tool for probing realistic inhomogeneous systems

Sakurai, Kenji, Mizusawa, Mari
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Volume:
15
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/15/6/021
Date:
June, 2004
File:
PDF, 323 KB
english, 2004
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