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Magneto-optical microscopy as a favourite tool to probe focused ion beam patterning at low dose
Ruotolo, A, Wiebel, S, Jamet, J P, Vernier, N, Pullini, D, Gierak, J, Ferré, JVolume:
17
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/17/13/038
Date:
July, 2006
File:
PDF, 218 KB
english, 2006