Non-contact atomic force microscopy study of atomic...

Nanotechnology 2006 / 04 Vol. 17; Iss. 7

Non-contact atomic force microscopy study of atomic manipulation on an insulator surface by nanoindentation

Nishi, Ryuji, Miyagawa, Daisuke, Seino, Yoshihide, Yi, Insook, Morita, Seizo
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Volume:
17
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/17/7/S07
Date:
April, 2006
File:
PDF, 1.23 MB
english, 2006
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