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Direct and controlled manipulation of nanometer-sized particles using the non-contact atomic force microscope
Ramachandran, T R, Baur, C, Bugacov, A, Madhukar, A, Koel, B E, Requicha, A, Gazen, CVolume:
9
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/9/3/015
Date:
September, 1998
File:
PDF, 744 KB
english, 1998