Surface and subsurface damages in nanoindentation tests of...

Surface and subsurface damages in nanoindentation tests of compound semiconductor InP

Yan, Jiwang, Tamaki, Jun'ichi, Zhao, Hongwei, Kuriyagawa, Tsunemoto
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Volume:
18
Language:
english
Journal:
Journal of Micromechanics and Microengineering
DOI:
10.1088/0960-1317/18/10/105018
Date:
October, 2008
File:
PDF, 1.38 MB
english, 2008
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