Real-time determination of plasma etch-rate selectivity
Sarfaty, Moshe, Baum, Chris, Harper, Michael, Hershkowitz, Noah, Shohet, J LeonVolume:
7
Language:
english
Journal:
Plasma Sources Science and Technology
DOI:
10.1088/0963-0252/7/4/015
Date:
November, 1998
File:
PDF, 240 KB
english, 1998