A percolation study of RTS noise in deep sub-micron MOSFET by Monte Carlo simulation
Zhong-Fa, Ma, Yi-Qi, Zhuang, Lei, Du, Shan, WeiVolume:
14
Language:
english
Journal:
Chinese Physics
DOI:
10.1088/1009-1963/14/4/029
Date:
April, 2005
File:
PDF, 208 KB
english, 2005