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Analysis of Langmuir-Blodgett overlayers by time-of-flight secondary ion mass spectrometry (TOF-SIMS)
Hagenhoff, B, Deimel, M, Benninghoven, A, Siegmund, H -U, Holtkamp, DVolume:
25
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/25/5/012
Date:
May, 1992
File:
PDF, 1.14 MB
english, 1992