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Interface roughness effects on the currents of resonant tunnelling hot electron transistor
Sheng, Hanyu, Chua, Soo-JinVolume:
27
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/27/8/018
Date:
August, 1994
File:
PDF, 276 KB
english, 1994