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A three-intensity technique for polarizer-sample-analyser photometric ellipsometry and polarimetry
Chao, Y F, Lee, Wen-Chi, Hung, C S, Lin, J JVolume:
31
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/31/16/005
Date:
August, 1998
File:
PDF, 153 KB
english, 1998