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Nondestructive determination of sheet carrier density in pseudomorphic AlGaAs/InGaAs/GaAs high electron mobility transistor structures by room-temperature photoluminescence spectra
Lu, Wu, Lee, Jin-Hee, Prasad, Krishnamachar, Ng, Geok-Ing, Lindström, PerVolume:
31
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/31/2/001
Date:
January, 1998
File:
PDF, 123 KB
english, 1998