Thickness and temperature dependence of electrical resistivity of p-type Bi 0.5 Sb 1.5 Te 3 thin films prepared by flash evaporation method
Duan, Xingkai, Yang, Junyou, Zhu, W, Fan, X A, Bao, S QVolume:
39
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/39/23/024
Date:
December, 2006
File:
PDF, 700 KB
english, 2006