An energy-dependent photoemission study on line-shape analysis in determining the absolute coverage of metallic thin films
Cheng, Cheng-Maw, Tsuei, Ku-Ding, Luh, Dah-AnVolume:
41
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/41/19/195302
Date:
October, 2008
File:
PDF, 132 KB
english, 2008