Secondary electron emission as a technique for in situ...

Journal of Physics E Scientific Instruments 1973 / 12 Vol. 6; Iss. 12

Secondary electron emission as a technique for in situ crystal alignment in low ion-energy reflection experiments

Feijen, H H W, Verhey, L K, Boers, A L, Suurmeijer, E P Th M
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Volume:
6
Language:
english
Journal:
Journal of Physics E: Scientific Instruments
DOI:
10.1088/0022-3735/6/12/005
Date:
December, 1973
File:
PDF, 227 KB
english, 1973
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