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Internal Strain of Silicon Studied by X-Ray Energy-Dispersive Diffraction
Cousins, C S G, Gerward, L, Olsen, J Staun, Selsmark, B, Sheldon, B JVolume:
25
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/25/6A/055
Date:
June, 1982
File:
PDF, 192 KB
english, 1982