Soft X-ray spectroscopy and the non-destructive chemical state analysis of thick films and surface layers (10-1000 nm)
McClusky, Philip, Urch, David SVolume:
41
Language:
english
Journal:
Physica Scripta
DOI:
10.1088/0031-8949/41/6/036
Date:
June, 1990
File:
PDF, 283 KB
english, 1990