Effect of N2 Plasma Annealing on Properties of Fluorine...

Effect of N2 Plasma Annealing on Properties of Fluorine Doped Silicon Dioxide Films with Low Dielectric Constant for Ultra-Large-Scale Integrated Circuits

Wei, Zhang, Peng-Fei, Wang, Shi-Jin, Ding, Ji-Tao, Wang, Wei, Lee William
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Volume:
19
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/19/6/339
Date:
June, 2002
File:
PDF, 191 KB
english, 2002
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