Interface Roughness Scattering on Electronic Transport in a...

Chinese Physics Letters 2003 / 10 Vol. 20; Iss. 10

Interface Roughness Scattering on Electronic Transport in a Quantum Well

Yi-Song, Zheng, Tian-Quan, L, Cheng-Xiang, Zhang, Wen-Hui, Su
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Volume:
20
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/20/10/354
Date:
October, 2003
File:
PDF, 224 KB
english, 2003
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