Comparative Characterization of InGaN/GaN Multiple Quantum...

Chinese Physics Letters 2005 / 10 Vol. 22; Iss. 10

Comparative Characterization of InGaN/GaN Multiple Quantum Wells by Transmission Electron Microscopy, X-Ray Diffraction and Rutherford Backscattering

Sheng-Qiang, Zhou, Ming-Fang, Wu, Shu-De, Yao, Guo-Yi, Zhang
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
22
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/22/10/067
Date:
October, 2005
File:
PDF, 303 KB
english, 2005
Conversion to is in progress
Conversion to is failed