Ellipsometric spectra and damage profiles of ion implanted...

Ellipsometric spectra and damage profiles of ion implanted silicon

Dang, Mo, Xingfei, He
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
3
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307X/3/5/010
Date:
May, 1986
File:
PDF, 212 KB
english, 1986
Conversion to is in progress
Conversion to is failed