Capacitance-voltage characteristic as a trace of the...

Semiconductor Science and Technology 2001 / 10 Vol. 16; Iss. 10

Capacitance-voltage characteristic as a trace of the exciton evolvement from spatially direct to indirect in quantum wells

Tang, Yan, Zheng, Houzhi, Yang, Fuhua, Tan, Pingheng, Li, Yuexia
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Volume:
16
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/16/10/302
Date:
October, 2001
File:
PDF, 144 KB
english, 2001
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