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Microwave irradiation impact on Ta 2 O 5 stack capacitors with different gates
Atanassova, E, Mitin, V F, Konakova, R V, Spassov, D, Schinkarenko, V VVolume:
23
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/23/3/035004
Date:
March, 2008
File:
PDF, 266 KB
english, 2008