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The role of Ce dopant on the electrical properties of GaSb single crystals, measured by far-infrared Fourier transform spectroscopy
Olvera-Cervantes, J, Plaza, J L, Diéguez, EVolume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/3/035007
Date:
March, 2009
File:
PDF, 123 KB
english, 2009