Electrical characterization of Ge–Sb–Te phase change...

Semiconductor Science and Technology 2009 / 07 Vol. 24; Iss. 7

Electrical characterization of Ge–Sb–Te phase change nano-pillars using conductive atomic force microscopy

Bae, Byeong-Ju, Hong, Sung-Hoon, Hwang, Seon-Yong, Hwang, Jae-Yeon, Yang, Ki-Yeon, Lee, Heon
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Volume:
24
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/0268-1242/24/7/075016
Date:
July, 2009
File:
PDF, 649 KB
english, 2009
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