In situhigh temperature x-ray diffraction measurements on a (TiO2)0.18(SiO2)0.82xerogel using a curved image-plate
D. M. Pickup, G. Mountjoy, M. A. Roberts, G. W. Wallidge, R. J. Newport, M. E. SmithYear:
2000
Language:
english
DOI:
10.1088/0953-8984/12/15/302
File:
PDF, 97 KB
english, 2000