Orientation and layer thickness dependence on the...

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Orientation and layer thickness dependence on the longitudinal magnetization and transverse magnetization hysteresis loops of sputtered multilayer Fe/Si and Fe/Ge thin films

N. A. Morley, M. R. J. Gibbs, K. Fronc, R. Zuberek
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Year:
2004
Language:
english
DOI:
10.1088/0953-8984/16/23/026
File:
PDF, 300 KB
english, 2004
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