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Electrically active defects in irradiated n-type Czochralski silicon doped with group IV impurities
M. L. David, E. Simoen, C. Claeys, V. Neimash, M. Kras’ko, A. Kraitchinskii, V. Voytovych, A. Kabaldin, J. F. BarbotYear:
2005
Language:
english
DOI:
10.1088/0953-8984/17/22/013
File:
PDF, 391 KB
english, 2005