Computational and experimental studies on strain-induced effects in a InGaAs/GaAs HFET structure usingC-Vprofiling
M. F. Kokorev, N. A. Maleev, D. V. Pakhnin, A. E. Zhukov, V. M. UstinovYear:
2001
Language:
english
DOI:
10.1088/0957-4484/12/4/324
File:
PDF, 101 KB
english, 2001