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Morphological study on pentacene thin-film transistors: the influence of grain boundary on the electrical properties
Chen, Fang-Chung, Chen, Ying-Pin, Huang, Yu-Jen, Chien, Shang-ChiehVolume:
43
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/43/40/405103
Date:
October, 2010
File:
PDF, 809 KB
english, 2010