Average depths of electron penetration: use as...

IEEE Transactions on Nuclear Science 1998 / 6 Vol. 45; Iss. 3

Average depths of electron penetration: use as characteristic depths of exposure

Lazurik, V., Moskvin, V., Tabata, T.
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Volume:
45
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.682461
Date:
June, 1998
File:
PDF, 539 KB
english, 1998
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