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[IEEE 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Russia (2015.6.29-2015.7.3)] 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - In/out pad electrostatic discharge protection for sub-micron integrated circuits based on lateral bipolar transistor
Karpovich, Maksim S., Pichugin, Igor V., Vasilyev, Vladislav Yu.Year:
2015
Language:
english
DOI:
10.1109/EDM.2015.7184499
File:
PDF, 557 KB
english, 2015