[IEEE 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Singapore, Singapore (2015.6.1-2015.6.4)] 2015 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Statistical variability and sensitivity analysis of dual-k spacer FinFET device-circuit co-design
Pal, Pankaj Kumar, Verma, Shivam, Kaushik, B. K., Dasgupta, S.Year:
2015
DOI:
10.1109/EDSSC.2015.7285082
File:
PDF, 999 KB
2015