SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Fabrication, Testing, and Reliability of Semiconductor Lasers II - Life testing and failure analysis of GaN/AlGaN/InGaN light-emitting diodes
Osinski, Marek, Barton, Daniel L., Helms, Christopher J., Berg, Niel H., Perlin, Piotr, Fallahi, Mahmoud, Wang, S. C.Volume:
3004
Year:
1997
Language:
english
DOI:
10.1117/12.273824
File:
PDF, 375 KB
english, 1997