SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Targets and Backgrounds VI: Characterization, Visualization, and the Detection Process - IR field reflectometer (EMIR): first results
Hamel, Christian, Millot, Jean-Francois, Janest, Alain, Watkins, Wendell R., Clement, Dieter, Reynolds, William R.Volume:
4029
Year:
2000
Language:
english
DOI:
10.1117/12.392523
File:
PDF, 3.41 MB
english, 2000