Nanoscale Electrostructural Characterization of...

ACS Applied Materials & Interfaces 2015 / 10

Nanoscale Electrostructural Characterization of Compositionally Graded Al x Ga 1– x N Heterostructures on GaN/Sapphire (0001) Substrate

Kuchuk, Andrian V., Lytvyn, Petro M., Li, Chen, Stanchu, Hryhorii V., Mazur, Yuriy I., Ware, Morgan E., Benamara, Mourad, Ratajczak, Renata, Dorogan, Vitaliy, Kladko, Vasyl P., Belyaev, Alexander E.,
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Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.5b07924
Date:
October, 2015
File:
PDF, 1.39 MB
english, 2015
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