[IEEE 2015 16th International Conference of Young...

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[IEEE 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices (EDM) - Erlagol, Russia (2015.6.29-2015.7.3)] 2015 16th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices - A study of 3D boss structure formation in anisotropic etching of Si (100) in aqueous KOH

Chernov, Artyom S., Chebanov, Mikhail A., Gridchin, Viktor A., Vasilyev, Vladislav Yu., Byalik, Alexander D.
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Year:
2015
Language:
english
DOI:
10.1109/EDM.2015.7184494
File:
PDF, 880 KB
english, 2015
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