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[IEEE 2014 2nd International Conference on Business and Information Management (ICBIM) - Durgapur, India (2014.1.9-2014.1.11)] 2014 2nd International Conference on Business and Information Management (ICBIM) - A conceptual model to develop an advanced plagiarism checking tool based on semantic matching
Sarkar, Arup, Marjit, Ujjal, Biswas, UtpalYear:
2014
Language:
english
DOI:
10.1109/ICBIM.2014.6970943
File:
PDF, 465 KB
english, 2014