[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Comprehensive models for the investigation of on-chip switching noise generation and coupling
Jae-Yong Ihm,, In Jae Chung,, Manetas, G., Cangellaris, A.C.Volume:
2
Year:
2005
Language:
english
DOI:
10.1109/ISEMC.2005.1513597
File:
PDF, 291 KB
english, 2005