SPIE Proceedings [SPIE 26th Annual International Symposium...

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SPIE Proceedings [SPIE 26th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 25 February 2001)] Optical Microlithography XIV - High-numerical-aperture 193-nm exposure tool

Sewell, Harry, Cote, Daniel R., Williamson, David M., Oskotsky, Mark L., Sakin, Lev, O'Neil, Tim, Zimmerman, John D., Zimmerman, Richard, Nelson, Mike, Mason, Christopher J., Ahouse, David, Harrold, H
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Volume:
4346
Year:
2001
Language:
english
DOI:
10.1117/12.435758
File:
PDF, 9.79 MB
english, 2001
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