High-speed dual-beam, crossed line-scanning fluorescence microscope with a point confocal resolution
Jeong, Hyun-Woo, Kim, Hyung-Jin, Eun, Jung, Heo, Seungjin, Lim, Mikyoung, Cho, Yong-Hoon, Kim, Beop-MinVolume:
54
Language:
english
Journal:
Applied Optics
DOI:
10.1364/ao.54.003811
Date:
April, 2015
File:
PDF, 829 KB
english, 2015