[IEEE 2014 International Conference on Information Science, Electronics and Electrical Engineering (ISEEE) - Sapporo, Japan (2014.4.26-2014.4.28)] 2014 International Conference on Information Science, Electronics and Electrical Engineering - Influence of cap-and-pin disc insulator profile on contamination flashover voltage
Yu, Xinzhe, Zhou, Jun, Liu, Bo, Huang, Ruiping, Su, ZhiyiYear:
2014
DOI:
10.1109/InfoSEEE.2014.6947824
File:
PDF, 301 KB
2014