SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - Towards a one step geometric calibration of an optical coherence tomography
Díaz Díaz, Jesús, Rahlves, Maik, Majdani, Omid, Reithmeier, Eduard, Ortmaier, Tobias, Harding, Kevin G., Huang, Peisen S., Yoshizawa, ToruVolume:
8563
Year:
2012
DOI:
10.1117/12.999276
File:
PDF, 3.33 MB
2012